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Four Industry Leaders Receive IPC President’s Award at IPC APEX EXPO 2025

03/21/2025 | IPC
In recognition of their leadership and significant contributions of time and talent to IPC and the electronics industry, four IPC volunteers were presented with the IPC President’s Award at IPC APEX EXPO in Anaheim, California, on March 18, 2025.

Paige Fiet: From Emerging Engineer to Quality at TTM

03/19/2025 | Marcy LaRont, PCB007 Magazine
Paige Fiet is a graduate of the IPC Emerging Engineer program and now works at TTM Technologies in Logan, Utah. She was an IPC Student Board Member and has been a columnist for I-Connect007. She is a stellar example and an encouragement to other young engineers about how to be successful in your early career.

Paige Fiet: From Emerging Engineer to Quality at TTM

03/19/2025 | I-Connect007 Editorial Team
Paige Fiet is a graduate of the IPC Emerging Engineer program and now works at TTM Technologies in Logan, Utah. She was an IPC Student Board Member and has been a columnist for I-Connect007. She is a stellar example and an encouragement to other young engineers about how to be successful in your early career.

Discover the New Podcast Series on Thermal Management—Now Available

03/05/2025 | I-Connect007
In this premiere podcast episode, Ryan Miller of NCAB breaks down why thermal management is a must for PCB designers. What are the main causes of excess heat in our designs today? Why does it matter? And how can designers keep their boards cool under pressure?

New Book Explores History of X-ray Technology and Application in Electronics Today

03/05/2025 | I-Connect007
As the field of electronics continues to evolve, X-ray inspection has become an indispensable tool for ensuring quality and reliability in manufacturing processes. In The Printed Circuit Assembler’s Guide to... X-ray Inspection, author Dr. Bill Cardoso, Creative Electron, discusses the development of contemporary X-ray machines, which incorporate advanced imaging, motion, and decision-making steps that facilitate precise defect detection.
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