Breaking Silos with Intelligence: Connectivity of Component-level Data Across the SMT Line

Estimated reading time: 1 minute

As the complexity and demands of electronics manufacturing continue to rise, the smart factory is no longer a distant vision; it has become a necessity. While machine connectivity and line-level data integration have gained traction in recent years, one of the most overlooked opportunities lies in the component itself. Specifically, in the data captured just milliseconds before a component is placed onto the PCB, which often goes unexamined and is permanently lost once reflow begins.

In many modern SMT lines, the pick-and-place machine captures high-resolution bottom-side images of components as part of the placement process. These images represent a unique opportunity: a real-time, untouched view of each component just before it is mounted. Once placed, this view is destroyed—either physically by solder or visually by occlusion. Yet, this is precisely the moment when critical information can be extracted. Issues like corrosion on leads, mechanical damage, probe marks from unauthorized programming, or foreign object debris (FOD) can all be detected from the underside view before the component becomes permanently embedded onto the board.

Inline X-ray systems, which until recently were the only method of optically examining components, are typically used to inspect the outcome: solder joints, alignment, and the presence of voids or bridges. While valuable, these systems focus on symptoms. Without insight into what the component looked like before it was placed, root cause analysis remains incomplete. For example, a void in a solder joint might appear to be a process failure when, in fact, it stems from oxidation or contamination on the component lead, something that could have been spotted ahead of time.

To continue reading this article, which originally appeared in the May 2025 issue of SMT007 Magazine, click here.