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Real Time with... IPC APEX EXPO 2025: Aster–Enhancing Design for Effective Testing Strategies

04/18/2025 | Real Time with...IPC APEX EXPO
Will Webb, technical director at Aster, stresses the importance of testability in design, emphasizing early engagement to identify testing issues. This discussion covers the integration of testing with Industry 4.0, the need for good test coverage, and adherence to industry standards. Innovations like boundary scan testing and new tools for cluster testing are introduced, highlighting advancements in optimizing testing workflows and collaboration with other tools.

Europe Network Functions Virtualization: The Future of Telecom Infrastructure

04/16/2025 | Persistence Market Research
Network Functions Virtualization (NFV) is rapidly transforming the telecommunications industry worldwide, and Europe is at the forefront of this digital transformation.

TDK Demonstrates the World's First ‘Spin Photo Detector’ Capable of 10X Data Transmission Speeds for the Next Generation of AI

04/16/2025 | PRNewswire
This new device is expected to be a key driver for implementing photoelectric conversion technology that boosts data transmission and data processing speed, particularly in AI applications, while simultaneously reducing power consumption.

The Test Connection, Inc. (TTCI) to Discuss Electronic Test & Manufacturing at the SMTA Capital Expo

04/15/2025 | The Test Connection Inc.
The Test Connection Inc. (TTCI), a leading provider of electronic test and manufacturing solutions, is pleased to announce its participation in the SMTA Capital Expo & Tech Forum on May 8, 2025, at the Waterford Springfield in Arlington, Virginia.

MVTec HALCON Version Includes Deep Learning-Based Technology for Robust Bin Picking

04/15/2025 | MVTec
MVTec Software GmbH, a leading global manufacturer of machine vision software, is launching the new version of MVTec HALCON on May 27, 2025. Version 25.05 of the standard machine vision software includes numerous improvements as well as a new technology that combines deep learning algorithms with classic methods.
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