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Marcy LaRont and Paul Handler of Aktrometrix share insights from the SMTAI show in Chicago. They address manufacturing challenges, particularly warpage issues, and discuss Akrometrix's solutions. Paul details three optical technologies for measuring warpage and thermal expansion, emphasizing the need for reliability and defect detection in production. The conversation also touches on new industry standards for board warpage, influenced by OEMs.

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During the complex and multi-step process of PCB fabrication, a panel's flatness is constantly at risk. A host of factors can introduce warpage, bending, and unevenness, presenting a fundamental challenge to achieving high-precision results. This deformation (sometimes referred to as “bow and twist”), even on a microscopic scale, can lead to critical defects during subsequent stages, such as component surface mounting (e.g., tombstoning, solder opens) and the PCB's long-term functional reliability.

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Akrometrix Announces 30 Year Anniversary as Industry Leader in Thermal Warpage Metrology

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Akrometrix is celebrating their 30 year anniversary as an industry leader in thermal warpage metrology. Professor Ifeanyi Charles Ume founded Akrometrix out of Georgia Tech 30 years ago to address issues in PCB flatness using the shadow moiré warpage measurement technique. 
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